Diffusion in nanolayers as measured by atom probing

Keilonat, Christian; Camus, Eric
October 1994
Applied Physics Letters;10/17/1994, Vol. 65 Issue 16, p2007
Academic Journal
Measures the diffusion of copper/nickel nanolayers by atom probing. Effects of diffusion in thin layer systems; Summary of the principle of atom probe technique; Representation of a nanolayer specimen as used for field-ion microscope with atom probe.


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