Apertureless near-field optical microscope

Zenhausern, F.; O'Boyle, M.P.
September 1994
Applied Physics Letters;9/26/1994, Vol. 65 Issue 13, p1623
Academic Journal
Demonstrates a method on near-field optical microscope extending to the nanometer regime. Measurement of the scattered electric field from the end of a sharp silicon tip; Detection of the vibrational signal at radio frequency; Application of spherical light scattering from a tip end of a standard of scanning tunnel microscopy to define the light source.


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