TITLE

Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and

AUTHOR(S)
Glanner, G.J.; Sitter, H.
PUB. DATE
August 1994
SOURCE
Applied Physics Letters;8/22/1994, Vol. 65 Issue 8, p998
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Evaluates the growth temperature, refractive index and layer thickness of thin ZnTe, MnTe, and CdTe films by in situ visible laser interferometry. Use of a GaP wafer as a growth temperature calibration standard; Discussion of the substrate temperature calibration curves; Analysis of the numerical values of refractive indices n at elevated temperatures.
ACCESSION #
4233078

 

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