X-ray diffractometric characterization of the GaAsP/GaAs and InGaAs/GaAsP superlattices grown on

Gaca, J.; Wojcik, M.
August 1994
Applied Physics Letters;8/22/1994, Vol. 65 Issue 8, p977
Academic Journal
Details the application of reciprocal space mapping to investigate superlattices (SL) grown on misoriented substrate. Calculation of the parameters describing superlattice geometry; Comparison of the accuracy of the results with that of other techniques; Use in the absence of the nodal SL reflection.


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