Cross-sectional transmission electron microscopy study for Nb/AlO[sub x]-Al/Nb

Morohashi, Shin'ichi; Hasuo, Shinya
October 1993
Applied Physics Letters;10/18/1993, Vol. 63 Issue 16, p2285
Academic Journal
Investigates the interfaces of niobium (Nb) Josephson junctions with an overlayer structure using cross-sectional transmission electron microscopy. Factors attributing the interface roughness between aluminum (Al) and Nb; Application of McMillan's proximity theory for Al/Nb interface analysis; Impact of thermal annealing on interface roughness.


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