Electro-optical characterization of Pb(Zr,Ti)O[sub 3] thin films by waveguide refractometry

Potter Jr., B.G.; Sinclair, M.B.
October 1993
Applied Physics Letters;10/18/1993, Vol. 63 Issue 16, p2180
Academic Journal
Examines the refractive index and thickness of lead zirconate titanate (PZT) film. Determination of electro-optic response in PZT films by waveguide refractometry technique; Association between sharp minima in reflected intensity and waveguiding modes in PZT film; Importance of electro-optics for polarization related phenomena in ferroelectric films.


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