TITLE

A/c YBa[sub 2]Cu[sub 3]O[sub 7] boundaries: Preferential sites for the nucleation of epitaxial

AUTHOR(S)
Catana, A.; Schlom, D.G.
PUB. DATE
August 1992
SOURCE
Applied Physics Letters;8/10/1992, Vol. 61 Issue 6, p720
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines Yttrium inclusions in mixed a- and c-axis oriented films. Applicability of electron diffraction, high resolution electron microscopy and image calculations; Analysis on the structure of precipitates and epitaxial orientations; Discussion on the lattice-matching arguments.
ACCESSION #
4232970

 

Related Articles

  • Quantum design and synthesis of a boron–oxygen–yttrium phase. Music, Denis; Chirita, Valeriu; Kreissig, Ulrich; Czigány, Zsolt; Schneider, Jochen M.; Helmersson, Ulf // Applied Physics Letters;6/16/2003, Vol. 82 Issue 24, p4286 

    Ab initio calculations are used to design a crystalline boron-oxygen-yttrium (BOY) phase. The essential constituent is yttrium substituting for oxygen in the boron suboxide structure (BO[SUB0.17]) with Y/B and O/B ratios of 0.07. The calculations predict that the BOY phase is 0.36 eV/atom more...

  • Influence of microstructure on the resistivity of Al-Cu-Si thin-film interconnects. Kim, Choongun; Selitser, S. I.; Morris, J. W. // Journal of Applied Physics;1/15/1994, Vol. 75 Issue 2, p879 

    Provides information on a study that examined the rate of resistivity decay in aluminum-2Cu-1Si thin-film conductors as a function of temperature and grain size distribution. Role of electrical resistivity in studying precipitation kinetics; Steps involved in the precipitation process from...

  • New method for epitaxial heterostructure layer growth. Mantl, Siegfried; Bay, Helge L. // Applied Physics Letters;7/20/1992, Vol. 61 Issue 3, p267 

    Demonstrates the fabrication of compound thin films inside single-crystalline matrices. Formation of a peaked depth distribution of AB[sub x] precipitates; Coalescence of the precipitates; Growth of buried epitaxial CoSi[sub 2] layers in silicon(100); Simultaneous epitaxial growth of the matrix...

  • Precipitates in YBa[sub 2]Cu[sub 3]O[sub 7-delta] thin films annealed at low oxygen partial.... Hou, S.Y.; Phillips, Julia M.; Werder, D.J.; Tiefel, T.H.; Fleming, R.M.; Marshall, J.H.; Siegal, M.P. // Applied Physics Letters;6/14/1993, Vol. 62 Issue 24, p3201 

    Investigates the precipitates in YBa[sub 2]Cu[sub 3]O[sub 7-delta] thin films annealed at low oxygen partial pressure. Advantages of high quality film ex situ growth; Effects of precipitate formation on film matrix; Influence of stoichiometric film precursor on film properties.

  • In situ thin-film texture determination. Litminov, Dmitri; O'Donnell, Thomas // Journal of Applied Physics;2/15/1999, Vol. 85 Issue 4, p2151 

    Presents information on a kinematic theory of reflection high energy electron diffraction (RHEED) for textured polycrystalline thin films. Analysis and discussion; Conclusions.

  • Effect of Al and Y incorporation on the structure of HfO2. Wang, X. F.; Li, Quan; Moreno, M. S. // Journal of Applied Physics;Nov2008, Vol. 104 Issue 9, p093529 

    We have investigated the structural changes in HfO2 thin films upon Y and Al incorporation. The crystallinity of the films is examined by transmission electron diffraction. The local coordination symmetries of the Hf atoms in the films are revealed by the profile of the oxygen K-edge measured in...

  • Solubility and formation of ternary Widmanstätten precipitates in PbTe in the pseudo-binary PbTe-BiTe system. Ikeda, Teruyuki; Toussaint, Marcus B.; Bergum, Kristin; Iwanaga, Shiho; Snyder, G. Jeffrey // Journal of Materials Science;Jun2011, Vol. 46 Issue 11, p3846 

    unidirectional solidification experiment by Bridgman method has been performed for the PbBiTe composition, which lies on the pseudo-binary PbTe-BiTe system, resulting in the formation of Widmanstätten precipitates of a ternary compound, most likely with the structure of PbBiTe in the PbTe...

  • In situ electrical conductivity and amorphous-crystalline transition in vacuum-deposited amorphous thin films of a Se50Te50 alloy. Damodara Das, V.; Jansi Lakshmi, P. // Journal of Applied Physics;9/15/1987, Vol. 62 Issue 6, p2376 

    Presents a study which showed in situ electrical conductivity measurements on vacuum-deposited amorphous thin films of various thicknesses of a Se[sub50]Te[sub50] alloy in the temperature range 300-430K. Preparation of the bulk polycrystalline alloy; Determination of the thicknesses of the...

  • Small angle electron diffraction and Foucault mode Lorentz microscopy of superconducting vortex... Yoshida, T.; Endo, J. // Journal of Applied Physics;1/15/1999, Vol. 85 Issue 2, p1228 

    Presents information on a study which examined the small angle electron diffraction patterns of superconducting vortex lattices in niobium (Nb) thin films using a field emission transmission electron microscope. Foucault mode Lorentz microscopy of vortices; Results and discussion; Conclusions.

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics