TITLE

Submicrometer modification of polymer surfaces with a surface force microscope

AUTHOR(S)
Jin, X.; Unertl, W.N.
PUB. DATE
August 1992
SOURCE
Applied Physics Letters;8/10/1992, Vol. 61 Issue 6, p657
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the use of surface force microscope in submicrometer modifications to several types of polyimide surfaces. Importance of force microscope as a tool to create an image surface structures; Advantages over higher resolution scanning tunneling microscope; Details on possible sources of contrast in surface force microscope images.
ACCESSION #
4232948

 

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