Tip artifacts of microfabricated force sensors for atomic force microscopy

Grutter, P.; Zimmermann-Edling, W.
June 1992
Applied Physics Letters;6/1/1992, Vol. 60 Issue 22, p2741
Academic Journal
Demonstrates the implication of intrinsic imperfections in the microfabrication process of atomic force microscopy sensors for the dominance of tip artifacts in rough surfaces imaging. Reflection of the mesoscopic tip shape by images; Need to characterize tip shape to formulate reliable sample-specific statements.


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