Raman analysis of light-emitting porous silicon

Zhifeng Sui; Leong, Patrick P.
April 1992
Applied Physics Letters;4/27/1992, Vol. 60 Issue 17, p2086
Academic Journal
Analyzes light-emitting porous silicon using the Raman technique. Width of the spectrum peaks; Use of the phonon confinement model; Diameter of the porous silicon; Employment of polarization configurations for structure identification.


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