Identification and correlation of microstructural defects with flux pinning in Ni-doped melt

Pavate, V.; Williams, L.B.
July 1994
Applied Physics Letters;7/11/1994, Vol. 65 Issue 2, p246
Academic Journal
Examines microstructural defects using transmission electron microscopy on melt textured Ni-doped and pristine YBaCu[sub 3]O[sub 7]-]. Influence of the microstructural imperfections on the flux pinning behavior; Considerable difference in the density and distribution of stacking faults; Observation of the dislocation nets and tangles.


Related Articles

  • Controlling flux pinning precipitates during MgB[sub 2] synthesis. Liao, X. Z.; Serquis, A. C.; Zhu, Y. T.; Huang, J. Y.; Peterson, D. E.; Mueller, F. M.; Xu, H. F. // Applied Physics Letters;6/10/2002, Vol. 80 Issue 23, p4398 

    MgB[sub 2] samples prepared by three different sets of synthesis parameters were investigated using transmission electron microscopy. Results suggest that oxygen dissolved in bulk MgB[sub 2] at high synthesis temperatures when the MgB[sub 2] samples were exposed to trace amount of oxygen from...

  • Strong pinning in ternary (Nd–Sm–Gd)Ba[sub 2]Cu[sub 3]O[sub y] superconductors. Muralidhar, M.; Nariki, S.; Jirsa, M.; Wu, Y.; Murakami, M. // Applied Physics Letters;2/11/2002, Vol. 80 Issue 6, p1016 

    We have studied the flux pinning in melt-textured (Nd[sub 0.33]Sm[sub 0.33]Gd[sub 0.33])Ba[sub 2]Cu[sub 3]O[sub y] NSG-123 superconductors with various numbers of Gd[sub 2]BaCuO[sub 5] (Gd-211) particles. Transmission electron microscopy (TEM) showed that submicron Gd-211 particles are uniformly...

  • Flux pinning by collective stacking faults in Y[sub 0.6]Ho[sub 0.4]Ba[sub 2]Cu[sub 3]O[sub y].... Yong Feng; Wen, J.G. // Applied Physics Letters;5/26/1997, Vol. 70 Issue 21, p2894 

    Investigates the correlation between microstructure and flux pinning of Y[sub 0.6]Ho[sub 0.4]Ba[sub 2]Cu[sub 3]O[sub y] sample prepared by powder melting method. Existence of novel stacking faults in the sample; Reduction of the stacking fault density; Observation of microstructure feature by...

  • Flux pinning by a-axis grains in c-axis-oriented Y-Ba-Cu-O films. Fuke, H.; Yoshino, H.; Yamazaki, M.; Thanh, T.D.; Nakamura, S.; Ando, K.; Kobayashi, Y. // Applied Physics Letters;5/25/1992, Vol. 60 Issue 21, p2686 

    Investigates the microstructure effect to improve the critical-current density properties for the YBCO crystal. Clarification of the pinning mechanism; Efficacy of the a- and c-axis grain as pinning centers; Composition of the film surface microstructures.

  • Transmission electron microscopy studies of crystal-to-amorphous transition in ion implanted... Ishimaru, Manabu; Harada, Shinsuke // Journal of Applied Physics;2/1/1997, Vol. 81 Issue 3, p1126 

    Studies the microstructure of ion implanted silicon at room temperature using cross-sectional transmission electron microscopy. Presence of buried amorphous layers; Characterization of damaged layers adjacent to the amorphous layers; Atomic structure of the damaged regions.

  • Study of the microstructure of low energy (70 keV) oxygen implanted silicon. Li, Y.; Kilner, J.A.; Hemment, P.L.F.; Robinson, A.K.; Zhang, J.P.; Reeson, K.J.; Marsh, C.D.; Booker, G.R. // Applied Physics Letters;12/9/1991, Vol. 59 Issue 24, p3130 

    Investigates the microstructure of silicon implanted with low energy oxygen. Use of ion channeling and transmission electron microscopy; Importance of damage distribution in deciding the final microstructure; Determination of the threading dislocation density in the overlayer.

  • Enhanced remanence in isotropic Fe-rich melt-spun Nd-Fe-B ribbons. Withanawasam, L.; Hadjipanayis, G. C.; Krause, R. F. // Journal of Applied Physics;5/15/1994, Vol. 75 Issue 10, p6646 

    Presents a study that investigated the magnetic and structural properties of Nd[sub2]Fe[sub14]B[sub1]/Fe composite magnets with high Fe content. Details on the grouping of the samples into three categories; Analysis of the microstructure of the samples with optimum coercivity by transmission...

  • The microstructural stability of Al(Cu) lines during electromigration. Shaw, T.M.; Hu, C.-K. // Applied Physics Letters;10/16/1995, Vol. 67 Issue 16, p2296 

    Examines the microstructural stability of aluminum/copper lines during electromigration. Utilization of transmission electron microscopy in the study; Occurrence of significant changes in the grain structure surrounding precipitates during testing; Presentation of the bamboo grains of either...

  • Occasional `long-range' nonequilibrium body-centered-cubic structures in NiFe/Cu spin valves. Geng, H.; Heckman, J.W. // Journal of Applied Physics;10/15/1999, Vol. 86 Issue 8, p4166 

    Presents information on a study which described conventional and high-resolution transmission electron microscopy (HRTEM) characterization of the microstructure of sputtered nickel iron/copper giant magnetoresistance spin valves sandwiched between thick niobium contact layers. Experimental...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics