Study of Si(001) 2x1 domain conversion during direct current and radiative heatings

Ichikawa, M.; Doi, T.
March 1992
Applied Physics Letters;3/2/1992, Vol. 60 Issue 9, p1082
Academic Journal
Examines silicon(001) 2x1 domain conversions induced by sample electric current. Use of microprobe reflection high-energy electron diffraction; Existence of diffusion anisotropy of silicon adatoms; Preservation of the domain terraces.


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