THz spectroscopy and source characterization by optoelectronic interferometry

Ralph, Stephen E.; Grischkowsky, D.
March 1992
Applied Physics Letters;3/2/1992, Vol. 60 Issue 9, p1070
Academic Journal
Demonstrates a type of terahertz (THz) optoelectronic interferometer. Measurement of the absorption coefficient of high-resistivity gallium arsenide; Production of interferograms with exceptional signal-to-noise ratios; Applicability of the system to THz time-domain spectroscopy.


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