Evidence for a 'brick wall' microstructure in epitaxial YBa[sub 2]Cu[sub 3]O[sub x] films

Gao, Z.X.; Heyvaert, I.
August 1994
Applied Physics Letters;8/8/1994, Vol. 65 Issue 6, p770
Academic Journal
Calculates the in-plane critical current density in epitaxial, c-axis oriented thin films. Variation of critical current density as a function of the oxygen content; Dominance of the coupling strength between the superconducting copper dioxide planes; Presence of a brick wall microstructure in the films.


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