TITLE

Evidence for a 'brick wall' microstructure in epitaxial YBa[sub 2]Cu[sub 3]O[sub x] films

AUTHOR(S)
Gao, Z.X.; Heyvaert, I.
PUB. DATE
August 1994
SOURCE
Applied Physics Letters;8/8/1994, Vol. 65 Issue 6, p770
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Calculates the in-plane critical current density in epitaxial, c-axis oriented thin films. Variation of critical current density as a function of the oxygen content; Dominance of the coupling strength between the superconducting copper dioxide planes; Presence of a brick wall microstructure in the films.
ACCESSION #
4221587

 

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