Z-scan measurement of chi[sup (3)] using top-hat beams

Zhao, W.; Palffy-Muhoray, P.
August 1994
Applied Physics Letters;8/8/1994, Vol. 65 Issue 6, p673
Academic Journal
Presents the Z-scan measurement of third-order optical nonlinearities using top-hat beams. Development of a graphical method; Determination of nonlinear refraction and absorption coefficients; Advantage of using top-hat beams; Comparison with the values obtained for the liquid crystal 4-cyano-4'-n-pentybiphenyl.


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