TITLE

Optical characterization of porous silicon by synchrotron radiation reflectance spectra analyses

AUTHOR(S)
Koshida, Nobuyoshi; Koyama, Hideki
PUB. DATE
November 1993
SOURCE
Applied Physics Letters;11/15/1993, Vol. 63 Issue 20, p2774
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the characterization of porous silicon (PS) electronic structure by optical reflectance spectra analyses. Measurement of PS reflectance spectra using synchrotron radiation source; Calculation of the optical constant spectral response; Occurrence of absorption edge blue shift in PS.
ACCESSION #
4221524

 

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