TITLE

Mapping of mobile charges on insulator surfaces with the electrostatic force microscope

AUTHOR(S)
Domansky, K.; Leng, Y.
PUB. DATE
September 1993
SOURCE
Applied Physics Letters;9/13/1993, Vol. 63 Issue 11, p1513
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the migration of surface ions on insulator surfaces. Use of electrostatic force microscope to image the spatial distribution of surface ions; Distribution of surface ions by the fringing fields of an open-gate field-effect transistor; Simultaneous imaging of the surface charge distribution and topography on a micrometer scale.
ACCESSION #
4221438

 

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