Auger recombination in modulated photoreflectance characterization of silicon wafers

Forget, B.C.; Fournier, D.
November 1992
Applied Physics Letters;11/9/1992, Vol. 61 Issue 19, p2341
Academic Journal
Characterizes the electronic transport properties in silicon wafers. Use of photoreflectance signal as a function of modulation frequency; Consideration of the Auger recombination in the proposed theoretical theory; Benefit of understanding the passage from thermal to free carriers regime in a photoreflectant experiment.


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