Etching of screw dislocations in YBa[sub 2]Cu[sub 3]O[sub 7] films with a scanning tunneling

Heyvaert, I.; Osquiguil, E.
July 1992
Applied Physics Letters;7/6/1992, Vol. 61 Issue 1, p111
Academic Journal
Analyzes the etching of screw dislocations in YBa[sub 2]Cu[sub 3]O[sub 7] films with a scanning tunneling microscope (STM). Importance of the bias voltage in the etching process; Factors attributing to the etching process; Advantages of using the STM technique.


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