TITLE

Etching of screw dislocations in YBa[sub 2]Cu[sub 3]O[sub 7] films with a scanning tunneling

AUTHOR(S)
Heyvaert, I.; Osquiguil, E.
PUB. DATE
July 1992
SOURCE
Applied Physics Letters;7/6/1992, Vol. 61 Issue 1, p111
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Analyzes the etching of screw dislocations in YBa[sub 2]Cu[sub 3]O[sub 7] films with a scanning tunneling microscope (STM). Importance of the bias voltage in the etching process; Factors attributing to the etching process; Advantages of using the STM technique.
ACCESSION #
4221254

 

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