Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy

van der Werf, Kees O.; Putman, Constant A.J.
August 1994
Applied Physics Letters;8/29/1994, Vol. 65 Issue 9, p1195
Academic Journal
Introduces an imaging mode for the atomic force microscope yielding images mapping the adhesion force between tip and sample. Application of force curve to adhesion mode atomic force microscope; Attainment of adhesion force images mapping parameters; Modulation of adhesion force.


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