TITLE

Measurement of the intersubband scattering rate in semiconductor quantum wells by excited state

AUTHOR(S)
Faist, Jerome; Capasso, Federico
PUB. DATE
September 1993
SOURCE
Applied Physics Letters;9/6/1993, Vol. 63 Issue 10, p1354
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Demonstrates the measurement of the intersubband lifetime in semiconductor quantum wells. Importance of understanding relaxation mechanism of electrons inside a quantum well; Predictions of Ferreira and Bastard based on theories; Measurement of the absorption spectra using Nicolet 800 Fourier transform infrared spectrometer.
ACCESSION #
4218036

 

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