Etching technique for transmission electron microscopy observation of nanostructure of visible

Teschke, O.; Goncalves, M.C.
September 1993
Applied Physics Letters;9/6/1993, Vol. 63 Issue 10, p1348
Academic Journal
Observes transmission electron microscopy of nanostructure of visible luminescent porous silicon using etching technique. Cause of pore formation in silicon; Observation of irregular matrix of pores; Independence of the large pore axis orientation with preferential etching direction.


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