TITLE

Confocal photoluminescence: A direct measurement of semiconductor carrier transport parameters

AUTHOR(S)
Yu-Chue Fong; Brueck, S.R.J.
PUB. DATE
September 1992
SOURCE
Applied Physics Letters;9/14/1992, Vol. 61 Issue 11, p1332
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the direct measurement of semiconductor carrier transport parameters using confocal photoluminescence. Translation of the collection aperture of the confocal microscopy arrangement; Implication of the transversely graded quantum well formed by metalorganic chemical vapor deposition.
ACCESSION #
4217965

 

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