Confocal photoluminescence: A direct measurement of semiconductor carrier transport parameters

Yu-Chue Fong; Brueck, S.R.J.
September 1992
Applied Physics Letters;9/14/1992, Vol. 61 Issue 11, p1332
Academic Journal
Examines the direct measurement of semiconductor carrier transport parameters using confocal photoluminescence. Translation of the collection aperture of the confocal microscopy arrangement; Implication of the transversely graded quantum well formed by metalorganic chemical vapor deposition.


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