TITLE

Observation and electronic characterization of two E' center charge traps in conventionally

AUTHOR(S)
Conley Jr., John F.; Lenahan, P.M.
PUB. DATE
October 1994
SOURCE
Applied Physics Letters;10/31/1994, Vol. 65 Issue 18, p2281
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines EP and E'[sub yp] defect precursors in paramagnetic oxygen deficient silicon sites (E') in thin film charge trapping. Determination of electronic properties in amorphous insulators through gate oxide charge trappings; Influence of hot hole injection on oxide space charge contribution of the EP center; Instability of E'[sub yp] resonance.
ACCESSION #
4207733

 

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