Observation and electronic characterization of two E' center charge traps in conventionally

Conley Jr., John F.; Lenahan, P.M.
October 1994
Applied Physics Letters;10/31/1994, Vol. 65 Issue 18, p2281
Academic Journal
Examines EP and E'[sub yp] defect precursors in paramagnetic oxygen deficient silicon sites (E') in thin film charge trapping. Determination of electronic properties in amorphous insulators through gate oxide charge trappings; Influence of hot hole injection on oxide space charge contribution of the EP center; Instability of E'[sub yp] resonance.


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