TITLE

Diffuse x-ray scattering from p[sup +] porous silicon by triple axis diffractometry

AUTHOR(S)
Koppensteiner, E.; Schuh, A.
PUB. DATE
September 1994
SOURCE
Applied Physics Letters;9/19/1994, Vol. 65 Issue 12, p1504
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Investigates the strain and microstructure of porous silicon (Si) by triple axis diffractometry. Information on the strain status and porosity of the porous Si; Correlation functions of the pores; Implication of intensity distribution measurements in diffuse x-ray scattering for crystallographic damage in the Si skeleton.
ACCESSION #
4207653

 

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