Thermal dependence of the refractive index of GaAs and AlAs measured using semiconductor

Talghader, J.; Smith, J.S.
January 1995
Applied Physics Letters;1/16/1995, Vol. 66 Issue 3, p335
Academic Journal
Measures the longitudinal optical mode shift with temperature in two vertical cavity surface-emitting laser (VCSEL) type optical resonators in gallium and aluminum arsenide layer structures. Differences of measurements in cavity behavior; Manifestation of thermal dependencies; Details on the cavities used.


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