TITLE

Thermal dependence of the refractive index of GaAs and AlAs measured using semiconductor

AUTHOR(S)
Talghader, J.; Smith, J.S.
PUB. DATE
January 1995
SOURCE
Applied Physics Letters;1/16/1995, Vol. 66 Issue 3, p335
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Measures the longitudinal optical mode shift with temperature in two vertical cavity surface-emitting laser (VCSEL) type optical resonators in gallium and aluminum arsenide layer structures. Differences of measurements in cavity behavior; Manifestation of thermal dependencies; Details on the cavities used.
ACCESSION #
4203910

 

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