Epitaxial regrowth of ruby on sapphire for an integrated thin film stress sensor

Wen, Q.; Clarke, D.R.
January 1995
Applied Physics Letters;1/16/1995, Vol. 66 Issue 3, p293
Academic Journal
Describes the formation of thin film ruby by epitaxial of chromium-doped amorphous alumina on sapphire. Incorporation of chromium onto aluminum cation sites by ion channeling measurements; Confirmation of regrown 1 and 2 luminescence lines; Indication of regrown ruby layer.


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