Alternative method for the activation and measurement of lateral forces using magnetically

Jarvis, S. P.; Tokumoto, H.
December 1999
Applied Physics Letters;12/13/1999, Vol. 75 Issue 24, p3883
Academic Journal
Demonstrates the use of a different design of atomic force microscope cantilever for the study of lateral forces during a tensile transition to contact. Dynamic measurements; Combination of magnetic and piezo lever activation; Resonance modes of the normal and lateral tip motion.


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