Tapping-mode atomic force microscopy and phase-imaging in higher eigenmodes

Stark, Robert W.; Drobek, Tanja
May 1999
Applied Physics Letters;5/31/1999, Vol. 74 Issue 22, p3296
Academic Journal
Explores the use of tapping-mode atomic force microscopy to study soft biological samples. Sensitivity of the tapping probe; Effects of higher eigenmodes of the vibrating cantilever; Suitability for imaging applications.


Related Articles

  • High-speed atomic force microscopy in liquid. Sulchek, T.; Hsieh, R.; Adams, J. D.; Adams, J.D.; Minne, S. C.; Minne, S.C.; Quate, C. F.; Quate, C.F.; Adderton, D. M.; Adderton, D.M. // Review of Scientific Instruments;May2000, Vol. 71 Issue 5 

    High-speed constant force imaging with the atomic force microscope (AFM) has been achieved in liquid. By using a standard optical lever AFM, and a cantilever with an integrated zinc oxide (ZnO) piezoelectric actuator, an imaging bandwidth of 38 kHz has been achieved; nearly 100 times faster than...

  • Atomic resolution imaging of a nonconductor by atomic force microscopy. Albrecht, T. R.; Quate, C. F. // Journal of Applied Physics;10/1/1987, Vol. 62 Issue 7, p2599 

    Presents a study that examined the capability of the atomic force microscope in imaging the surface of an electrically insulating solid with atomic resolution. Background on atomic force microscopy; Analysis of the lever-sample interaction; Results and implications.

  • Improved atomic force microscope images using microcantilevers with sharp tips. Akamine, S.; Barrett, R. C.; Quate, C. F. // Applied Physics Letters;7/16/1990, Vol. 57 Issue 3, p316 

    Novel force-sensing microcantilevers with sharp tips have been used to obtain atomic force microscope images of atomically flat, layered compounds as well as microfabricated samples with large-scale topographies. When imaging atomically flat samples using cantilevers with sharp protruding tips,...

  • High-speed tapping mode imaging with active Q control for atomic force microscopy. Sulchek, T.; T. Sulchek; Hsieh, R.; Adams, J. D.; Adams, J.D.; Yaralioglu, G. G.; Yaralioglu, G.G.; Minne, S. C.; Minne, S.C.; Quate, C. F.; Quate, C.F.; Cleveland, J. P.; Cleveland, J.P.; Atalar, A.; Adderton, D. M.; Adderton, D.M. // Applied Physics Letters;3/13/2000, Vol. 76 Issue 11 

    The speed of tapping mode imaging with the atomic force microscope (AFM) has been increased by over an order of magnitude. The enhanced operation is achieved by (1) increasing the instrument's mechanical bandwidth and (2) actively controlling the cantilever's dynamics. The instrument's...

  • Ac-mode atomic force microscope imaging in air and solutions with a thermally driven bimetallic... Hillier, Andrew C.; Bard, Allen J. // Review of Scientific Instruments;May97, Vol. 68 Issue 5, p2082 

    Describes the development of an alternating current imaging mode for atomic force microscopy that employs a thermally driven bimetallic cantilever to sense surface topography. Variety of substrates used for imaging; Thermal response of the bimetallic cantilever; Response of the cantilever to...

  • Semi-automatic atomic force microscope for imaging in solution. Jianxun Mou; Gang Huang; Zhifeng Shao // Review of Scientific Instruments;Dec1995, Vol. 66 Issue 12, p5527 

    Describes a semiautomatic atomic force microscope for imaging in solution. Design considerations; Diagram and photograph of the microscope; Use of a rotating mirror to deflect the optical signal onto a fixed photodetector.

  • A simple modification of a commercial atomic force microscopy liquid cell for in situ imaging in... Wade, Travis; Garst, John F.; Stickney, John L. // Review of Scientific Instruments;Jan1999, Vol. 70 Issue 1, p121 

    Describes modifications to a commercial atomic force microscopy fluid cell to enable imaging in organic and reactive environments and to show initial images obtained within this cell. Modifications to the Digital Instruments Nanoscope III; Features of the fluid cell; Instrument to measure the...

  • Qualitative relationships describing height and phase images of tapping mode atomic force microscopy. An application to micro-contact-printed patterned self-assembled monolayers. Whangbo, M.H.; Bar, G.; Brandsch, R. // Applied Physics A: Materials Science & Processing;1998, Vol. 66 Issue 7, pS1267 

    Abstract. Qualitative relationships useful for interpreting height and phase images of tapping mode atomic force microscopy are derived under the approximation that the force constant of the cantilever changes slightly by the interaction of the tip with a sample surface. These relationships...

  • Imaging antigens by force. DeWitt, Natalie // Nature Biotechnology;Sep99, Vol. 17 Issue 9, p840 

    Focuses on the use of atomic force microscopy tip with an antibody attached by a flexible tether for imaging antigenic sites on a surface. Potential applications of the method.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics