Switching and memory phenomena in Langmuir-Blodgett films with scanning tunneling microscope

Takimoto, K.; Kawade, H.
December 1992
Applied Physics Letters;12/21/1992, Vol. 61 Issue 25, p3032
Academic Journal
Examines the switching and memory phenomena in probe/Langmuir-Blodgett (LB) film/metal structure. Use of scanning tunneling microscopy (STM); Current-voltage characteristics of the structure; Correlation between conductance and voltage charge magnitudes; Relation between LB film conductance and STM images changes.


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