On the theory of steady-state electromigration in thin films

Bauer, C.L.; Mullins, W.W.
December 1992
Applied Physics Letters;12/21/1992, Vol. 61 Issue 25, p2987
Academic Journal
Presents a theory of steady-state electromigration along grain boundaries in a monoatomic polycrystalline thin films. Achievement of zero flux divergence by balancing electric and stress driving forces; Linearity of equations for potential and elastic equilibrium; Determination of stress and steady-state fluxes by a set of linear equations.


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