TITLE

Frequency analysis of reflection high-energy electron diffraction intensity oscillations during

AUTHOR(S)
Garcia, B.J.; Fontaine, C.
PUB. DATE
January 1995
SOURCE
Applied Physics Letters;1/30/1995, Vol. 66 Issue 5, p610
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the behavior of reflection high-energy electron diffraction (RHEED) intensity oscillations during molecular beam epitaxial (MBE) growth of gallium arsenide. Surface defects of MBE growth; Observation of double frequency oscillations in substrate temperatures; Effect of growth rate deduction on RHEED frequency analysis.
ACCESSION #
4177304

 

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