Lateral force curve for atomic force/lateral force microscope calibration

Fujisawa, Satoru; Kishi, Eigo
January 1995
Applied Physics Letters;1/23/1995, Vol. 66 Issue 4, p526
Academic Journal
Describes the use of novel force curve for atomic force microscope (FM) calibration. Application of optical lever deflection method for cantilever deflection; Proportionality between spring displacement and scanning distance; Expression of FM functions in optical lever deflection method.


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