TITLE

Quantitative measurement of the stress transfer function in nickel/polyimide thin film/copper

AUTHOR(S)
Schadler, L.; Noyan, I.C.
PUB. DATE
January 1995
SOURCE
Applied Physics Letters;1/2/1995, Vol. 66 Issue 1, p22
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Analyzes the quantitative measurement of stress transfer behavior in multilayer thin films structures (nickel/ploymide/copper). Use of x-ray stress analysis; Similarity of shape of the stress transfer function with the shear lag model; Comparison between electroplated films and evaporated films.
ACCESSION #
4167640

 

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