Spatial analysis of electronic noise in submicron semiconductor structures

Gonzales, Tomas; Pardo, Daniel
July 1993
Applied Physics Letters;7/5/1993, Vol. 63 Issue 1, p84
Academic Journal
Investigates the electronic noise in semiconductor structures. Use of spatial analysis of the spectral density in voltage fluctuations; Effect of local drift velocity on low-frequency noise; Behavior of the voltage spectral density in electronic devices.


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