Low-threshold ablation of dielectrics irradiated by picosecond soft x-ray laser pulses

Faenov, A. Ya.; Inogamov, N. A.; Zhakhovskii, V. V.; Khokhlov, V. A.; Nishihara, K.; Kato, Y.; Tanaka, M.; Pikuz, T. A.; Kishimoto, M.; Ishino, M.; Nishikino, M.; Nakamura, T.; Fukuda, Y.; Bulanov, S. V.; Kawachi, T.
June 2009
Applied Physics Letters;6/8/2009, Vol. 94 Issue 23, p231107
Academic Journal
Ablation of LiF crystal by soft x-ray laser (XRL) pulses with wavelength λ=13.9 nm and duration TL=7 ps is studied experimentally and theoretically. It is found that a crater appears on a surface of LiF for XRL fluence, exceeding the ablation threshold Fa∼10.2 mJ/cm2 in one shot, or 5 mJ/cm2 in each of the three XRL shots. This is substantially below the ablation thresholds obtained with other lasers having longer pulse duration and/or longer wavelength. A mechanism of thermomechanical ablation in large bandgap dielectrics is proposed. The theory explains the low Fa via small attenuation depth, absence of light reflection, and electron heat conductivity.


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