TITLE

Interface morphologies and interlayer diffusions in organic light emitting device by x-ray scattering

AUTHOR(S)
Young Joo Lee; Park, Seong-Sik; Jinwoo Kim; Hyunjung Kim
PUB. DATE
June 2009
SOURCE
Applied Physics Letters;6/1/2009, Vol. 94 Issue 22, p223305
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Surface and interface morphologies with thermal expansions and interlayer diffusions in organic light emitting device [LiF/tris-(8-hydroxyquinoline) aluminum (Alq3)/N,N′-bis(naphthalen-1-yl)-N,N′-bis(phenyl)benzidine (NPB)/copper phthalocyanine (CuPc)/indium tin oxide/SiO2/glass] were studied by synchrotron x-ray scattering. Interface sharpness and roughness correlation are held under annealing at 100 °C up to 1 h and at 120 °C up to 0.25 h in spite of thermal expansions and interlayer diffusions of NPB and Alq3 layers. The roughness correlation at the interfaces was recovered partially when the interlayer diffusions reach quasisaturation. Crystallization of NPB is hindered due to the interlayer diffusions and appears at much higher temperature than its glass transition.
ACCESSION #
41139454

 

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