TITLE

A simple atomic force microscopy calibration method for direct measurement of surface energy on nanostructured surfaces covered with molecularly thin liquid films

AUTHOR(S)
Brunner, Ralf; Etsion, Izhak; Talke, Frank E.
PUB. DATE
May 2009
SOURCE
Review of Scientific Instruments;May2009, Vol. 80 Issue 5, p055109
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A simple calibration method is described for the determination of surface energy by atomic force microscopy (AFM) pull-off force measurements on nanostructured surfaces covered with molecularly thin liquid films. The method is based on correlating pull-off forces measured in arbitrary units on a nanostructured surface with pull-off forces measured on macroscopically smooth dip-coated gauge surfaces with known surface energy. The method avoids the need for complex calibration of the AFM cantilever stiffness and the determination of the radius of curvature of the AFM tip. Both of the latter measurements are associated with indirect and less accurate measurements of surface energy based on various contact mechanics adhesion models.
ACCESSION #
40638030

 

Related Articles

  • On liquid-film thickness measurements with the atomic-force microscope. Forcada, Mikel L.; Jakas, Mario M.; Gras-Martí, Alberto // Journal of Chemical Physics;7/1/1991, Vol. 95 Issue 1, p706 

    We provide a theoretical description of some recent measurements where the thicknesses of solid-supported thin lubricant films are measured using the atomic-force microscope [Mate et al., J. Chem. Phys. 90, 7550 (1989)]. In our model, the differences observed between the thicknesses measured...

  • Advanced Characterization of Material Properties on the Nanometer Scale Using Atomic Force Microscopy. Fenner, M. A.; Wu, S.; Yu, J.-J.; Huber, H.-P.; Kienberger, F. // Acta Physica Polonica, A.;Feb2012, Vol. 121 Issue 2, p416 

    We report recent advances in material characterization on the nanometer scale using scanning microwave microscopy. This combines atomic force microscopy and a vector network analyzer using microwave tip sample interaction to characterize dielectric and electronic material properties on the...

  • Improved surface morphology and texture of Ag films on indium tin oxide via Cu additions. Han, H.; Zoo, Yeongseok; Mayer, J. W.; Alford, T. L. // Journal of Applied Physics;8/1/2007, Vol. 102 Issue 3, p036101 

    The surface and texture properties of Ag(Cu) alloy thin films on indium tin oxide (ITO) has been investigated and compared to pure Ag thin films on ITO. Atomic force microscopy (AFM) and x-ray diffraction results of annealed films show differences in the evolution of surface morphology and...

  • Nanometer-scale conversion of Si[sub 3]N[sub 4] to SiO[sub x]. Chien, F. S.-S.; Chang, J.-W.; Lin, S.-W.; Chou, Y.-C.; Chen, T. T.; Gwo, S.; Chao, T.-S.; Hsieh, W.-F. // Applied Physics Letters;1/17/2000, Vol. 76 Issue 3 

    It has been found that atomic force microscope (AFM) induced local oxidation is an effective way for converting thin (<5 nm) Si[sub 3]N[sub 4] films to SiO[sub x]. The threshold voltage for the 4.2 nm film is as low as 5 V and the initial growth rate is on the order of 10[sup 3] nm/s at 10 V....

  • Nanoindentation Emerging As an Important Use for AFMs. Comello, Vic // R&D Magazine;Aug99, Vol. 41 Issue 9, p109 

    Reports on the application of atomic force microscopes (AFM) for indentation and imaging of thin films. Characteristics of a nanoscale film; Information on a nanoindentation instrument developed by Liam McDonnell, who manages the Center for Surface and Interface Analysis at the Cork Institute...

  • Surface morphology of laser deposited diamondlike films by atomic force microscopy imaging. Park, Hwantae; Hong, Young-Kyu; Kim, Jin Seung; Park, Chan; Kim, Jae Ki // Applied Physics Letters;8/5/1996, Vol. 69 Issue 6, p779 

    The surface morphologies of diamondlike carbon (DLC) films with atomic force microscopy (AFM) are reported. The films were prepared by laser ablation with tuning power densities range from 3×108 to 1×1010 W/cm2. For power densities above 2×109 W/cm2, the films reveal smooth surfaces...

  • Step flow growth of (La,Ca)MnO[sub delta] thin films on (110)NdGaO[sub 3]. Zeng, X.T.; Wong, H.K. // Applied Physics Letters;11/27/1995, Vol. 67 Issue 22, p3272 

    Observes step flow growth patterns on a single-crystal (La,Ca)Mn[sub delta](LCMO) thin films using atomic force microscopy. Use of facing-target sputtering method in growing the films; Alignment and spacing of the steps; Average step width of the best sample; Parallelism of the step edges to...

  • Micro-fabricated piezoelectric cantilever for atomic force microscopy. Watanabe, Shunji; Fujii, Toru // Review of Scientific Instruments;Nov96, Vol. 67 Issue 11, p3898 

    Presents a study that successfully developed an atomic force microscope with a batch-fabricated silicon cantilever with a pyramidal stylus. High quality lead zirconate titanate piezoelectric thin film that allows displacement sensing and actuating; Use of a lever as an actuator for z feedback...

  • Microstructural dependence of penetration depth of Ag-doped YBa[sub 2]Cu[sub 3]O[sub 7-delta].... Pinto, R.; Kaur, Davinder // Applied Physics Letters;3/18/1996, Vol. 68 Issue 12, p1720 

    Examines the microstructural dependence of penetration depth of thin films using atomic force microscopy. Physical quantities of superconductivity; Use of the microstrip resonator technique in the measurement of the lambda; Correlation between lambda and the film microstructure.

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics