TITLE

Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation

AUTHOR(S)
Ziegler, Mathias; Tomm, Jens W.; Reeber, David; Elsaesser, Thomas; Zeimer, Ute; Larsen, Henning E.; Petersen, Paul M.; Andersen, Peter E.
PUB. DATE
May 2009
SOURCE
Applied Physics Letters;5/11/2009, Vol. 94 Issue 19, p191101
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 μs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
ACCESSION #
39785873

 

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