Tip-enhanced two-photon excited fluorescence microscopy with a silicon tip

Hayazawa, Norihiko; Furusawa, Kentaro; Taguchi, Atsushi; Kawata, Satoshi; Abe, Hiroshi
May 2009
Applied Physics Letters;5/11/2009, Vol. 94 Issue 19, p193112
Academic Journal
The use of silicon tips and nonlinear response of materials can be used in overcoming the two major drawbacks of the near-field fluorescence detection which are quenching and background signals. Silicon tips allow for quenching free detection while the two-photon excitation scheme selectively enhances the scattering rate near the tip apex, so that the fluorescence signal from this tiny volume outweighs the one from diffraction limited focused spot. We demonstrate tip-enhanced two-photon excited fluorescence microscopy using a commercially available silicon cantilever tip, and show that individual quantum dots can be clearly resolved with spatial separation of 70 nm.


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