High Precision Noise Measurements at Microwave Frequencies

Ivanov, Eugene; Tobar, Michael
April 2009
AIP Conference Proceedings;4/23/2009, Vol. 1129 Issue 1, p611
Academic Journal
We describe microwave noise measurement system capable of detecting the phase fluctuations of rms amplitude of [formula] Such resolution allows the study of intrinsic fluctuations in various microwave components and materials, as well as precise tests of fundamental physics. Employing this system we discovered a previously unknown phenomenon of down-conversion of pump oscillator phase noise into the low-frequency voltage fluctuations.


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