Predictability of reset switching voltages in unipolar resistance switching

Lee, S. B.; Chae, S. C.; Chang, S. H.; Noh, T. W.
April 2009
Applied Physics Letters;4/27/2009, Vol. 94 Issue 17, p173504
Academic Journal
In unipolar resistance switching of NiO capacitors, Joule heating in the conducting channels should cause a strong nonlinearity in the low resistance state current-voltage (I-V) curves. Due to the percolating nature of the conducting channels, the reset current IR can be scaled to the nonlinear coefficient Bo of the I-V curves, i.e., IR∝Bo-x. This scaling relationship can be used to predict reset voltages, independent of NiO capacitor size; it can also be applied to TiO2 and FeOy capacitors. Using this relation, we developed an error correction scheme to provide a clear window for separating reset and set voltages in memory operations.


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