Depth resolution of piezoresponse force microscopy

Johann, Florian; Ying, Yongjun J.; Jungk, Tobias; Hoffmann, Ákos; Sones, Collin L.; Eason, Robert W.; Mailis, Sakellaris; Soergel, Elisabeth
April 2009
Applied Physics Letters;4/27/2009, Vol. 94 Issue 17, p172904
Academic Journal
Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.


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