Optical memory of silicon nanocrystals with submicron spatial resolution and very high thermal stability

Nikitin, Timur; Khriachtchev, Leonid; Räsänen, Markku; Novikov, Sergei
April 2009
Applied Physics Letters;4/27/2009, Vol. 94 Issue 17, p173116
Academic Journal
Crystallization of Si nanostructures in free-standing Si/SiO2 superlattice films by a strongly focused laser beam is studied. The structural change is obtained in small areas of submicron sizes, which is detectable by camera photographs and by Raman scattering and transmission measurements. The obtained optical changes are stable at very high temperatures as shown by prolonged furnace annealing at 1200 °C. An approach based on silicon stress state is also presented, which allows erasing and rewriting data readable by Raman spectroscopy. These results can be used for nonvolatile data storage.


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