Determination of energy band gap of nanocrystalline SbSI using diffuse reflectance spectroscopy

Nowak, M.; Kauch, B.; Szperlich, P.
April 2009
Review of Scientific Instruments;Apr2009, Vol. 80 Issue 4, p046107
Academic Journal
Twelve methods of determining energy band gap (Eg) of semiconductors using diffuse reflectance spectroscopy have been applied in investigations of sonochemically produced antimony sulfoiodide (SbSI) consisting of nanowires. It has been proved that the best method of determining Eg is based on simultaneous fitting of many mechanisms of absorption to the spectral dependence of Kubelka–Munk function evaluated from the diffuse reflectance data. It allows determining the values of indirect forbidden Eg, the Urbach energy, and the constant absorption/scattering of the examined semiconductor.


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