Detailed plasma potential measurements in a radio-frequency expanding plasma obtained from various electrostatic probes

Lafleur, T.; Charles, C.; Boswell, R. W.
April 2009
Physics of Plasmas;Apr2009, Vol. 16 Issue 4, p044510
Academic Journal
On-axis plasma potential measurements have been made with an emissive probe in a low pressure (0.044 Pa) rf expanding plasma containing an ion beam. The beam is detected with a retarding field energy analyzer (RFEA), and is seen to disappear at high pressure (0.39 Pa). The emissive probe measurements are in very good agreement with corresponding measurements made with two separate RFEAs, and the results indicate that the floating potential of the strongly emitting probe gives an accurate measure of the plasma potential under the present conditions.


Related Articles

  • Instability of ion flows in bounded dusty plasma systems. Rosenberg, M.; Shukla, P.K. // Physics of Plasmas;Oct98, Vol. 5 Issue 10, p3786 

    Examines the effect of longitudinal boundaries on electrostatic instabilities driven by an ion beam in a dusty plasma. Instability of low-frequency ion-space-charge waves and ion-dust waves; Estimation of ion current thresholds and growth rates; Implication for the design of large scale dusty...

  • Experimental and theoretical study of the properties of plasma containing a hemispherically focused ion beam. Peterson, J. M.; Oleson, N. L. // Physics of Fluids B: Plasma Physics;Apr92, Vol. 4 Issue 4, p888 

    Argon plasmas were produced in a modified multipole plasma device in which the electrons in the two plasmas were isolated by a hemispherical center grid biased negatively. Whenever ion beams are caused to stream from the driver plasma into the target plasma, an additional cold group of...

  • Calibration of the heavy ion beam probe parallel plate analyzer using the gas target and reference beam Melnikov, A. V.; Kharchev, N. K.; Eliseev, L. G.; Bondarenko, I. S.; Krupnik, L. I.; Khrebtov, S. M.; Nedzelskij, I. S.; Trofimenko, Yu. V. // Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p308 

    Develops a procedure of fast calibration of the heavy ion beam probe parallel plate analyzer using the gas target and reference beam. Test facility in vitro calibration; Gas target in situ calibration; Nonideal effects in calibration.

  • Heavy ion beam probe systems for tight aspect ratio toKamaKs Melnikov, A. V.; Zimeleva, L. G.; Krupnik, L. I.; Nedzelskij, I. S.; Trofimenko, Y. V.; Minaev, V. B. // Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p316 

    Discusses the specific features of the application of heavy ion beam probe systems to tight aspect ratio tokamaks. Brief description of the observed tokamaks from the viewpoint of the probing beam pass; Optimization procedure; Three-dimensional case.

  • A study for the installation of the TEXT heavy-ion beam probe on DIII-D Edmonds, P. H.; Solano, E. R.; Bravenec, R. V.; Wootton, A. J.; Schoch, P.M.; Crowley, T. P.; Hickok, R. L.; West, W. P.; Leuer, J.; Anderson, P. // Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p320 

    Discusses the results of an assessment of the feasibility of installing the TEXT 2 MeV heavy-ion beam probe (HIBP) on the DIII-D tokamak. Background information on the HIBP diagnostic; Expected diagnostic performance; Design procedure; Key design issues.

  • Heavy ion beam probe diagnostics on TJ-1 tokamak and the measurements of the plasma potential and density profiles Bondarenko, I. S.; Khrebtov, S. M.; Krupnik, L. I.; Nedzelskij, I. S.; Gordeev, O. A.; Kharchev, N K.; Melnikov, A, V.; Tarasyan, K. N.; Zimeleva, L. G.; Hidalgo, C.; Garcia-Codes, I. // Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p312 

    Describes the application of the heavy ion beam probe (HIBP) diagnostics to the investigation of the plasma density and potential in the TJ-1 tokamak. Analyzer characteristics, calibration procedures and analysis of the plasma potential data; Plasma density.

  • Measurements of plasma fluctuations with a heavy-ion beam probe. Hallock, G. A.; Schoch, P. M.; Saadatmand, K.; Hickok, R. L.; Jennings, W. C.; Connor, K. A. // Review of Scientific Instruments;May85, Vol. 56 Issue 5, p1038 

    A heavy-ion beam probe can provide simultaneous, spatially resolved measurements of &φtilde;; and (ñσ[sub eff]) in magnetically confined plasmas. Capabilities have been demonstrated on TMX, RENTOR, and ISX-B using single detector systems, which permit the evaluation of the frequency...

  • New and simple optical method for in situ etch rate determination and endpoint detection. Heinrich, F.; Stoll, H.-P.; Scheer, H.-C. // Applied Physics Letters;10/2/1989, Vol. 55 Issue 14, p1474 

    Optical emission spectroscopy has been established as a simple method for simultaneous etch rate determination and endpoint detection in ion beam etching. During the sputtering of a thin layer with a refractive index different from the substrate interference is detected in the reflected light...

  • Dependencies of secondary electron yields on work function for metals by electron and ion bombardment. Kudo, M.; Sakai, Y.; Ichinokawa, T. // Applied Physics Letters;6/5/2000, Vol. 76 Issue 23 

    Secondary electron yields depending on work function were measured for 30 species of metal in ultrahigh vacuum by electron and ion bombardment. Secondary electron yields induced by electrons at 10 keV increase with work function, while those by Ar[sup +] ions at 3 keV decrease with increasing...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics