TITLE

Parallel imaging/manipulation force microscopy

AUTHOR(S)
Xie, H.; Haliyo, D. S.; Régnier, S.
PUB. DATE
April 2009
SOURCE
Applied Physics Letters;4/13/2009, Vol. 94 Issue 15, p153106
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Conventional atomic force microscope nanomanipulation is inefficient because of the serial imaging/manipulation operation. We present here a parallel imaging/manipulation force microscope (PIMM) to improve manipulation efficiency. The PIMM is equipped with two individually actuated cantilevers with protrudent tips. One cantilever acts as an imaging sensor by scanning nano-objects and tip of the other cantilever that is used as a manipulating tool. Two manipulation schemes were introduced to fulfill parallel imaging/manipulation tasks with normal and high-speed image scan, respectively. Performance of the PIMM was validated by the parallel imaging/manipulation of nanoparticles to form a nanopattern with a commonly used pushing operation.
ACCESSION #
37831857

 

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