Counting graphene layers on glass via optical reflection microscopy

Gaskell, P. E.; Skulason, H. S.; Rodenchuk, C.; Szkopek, T.
April 2009
Applied Physics Letters;4/6/2009, Vol. 94 Issue 14, p143101
Academic Journal
We show that optical reflection microscopy is a reliable method to simultaneously locate and count graphene layers deposited on bulk, transparent substrates such as soda-lime glass. The visible contrast in optical reflection versus graphene layer number is resolvable on bulk substrates. A simple Fresnel theory based on the universal optical conductance of graphene layers accurately models optical reflection images taken at a wavelength of 550±5 nm. We directly count one to nine layers of graphene using reflection microscopy.


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