TITLE

Red lights, camera, photoactivation!

AUTHOR(S)
Hess, Samuel T.
PUB. DATE
February 2009
SOURCE
Nature Methods;Feb2009, Vol. 6 Issue 2, p124
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The article reports that two groups present new photoactivatable fluorescent proteins that extend the range of available probes. It claims that these new probes will be crucial for advancing localization microscopy technology. Related issues are further discussed including electron microscopy and resolution microscopy.
ACCESSION #
37381324

 

Related Articles

  • Imaging guidelines for SCANNING ELECTRON MICROSCOPY. Laudate, Tony // Advanced Materials & Processes;Jul2003, Vol. 161 Issue 7, p23 

    Examines the causes of image deficiencies in scanning electron microscopy. Interactions between the electron probe and specimen; Consideration of the improper specimen preparation; Identification of external disturbances.

  • Sequential Growth and Etching of Gold Nanocrystals Revealed by High‐Resolution Liquid Electron Microscopy. Kim, Sang Yun; Dae, Kyun Seong; Koo, Kunmo; Kim, Daewoon; Park, Jungjae; Yuk, Jong Min // Physica Status Solidi. A: Applications & Materials Science;4/10/2019, Vol. 216 Issue 7, pN.PAG 

    Sequential growth and etching of Au nanoparticles in solution are observed in situ using the graphene liquid cell electron microscopy. Observation reveals that concentration of etching ions in aqueous growth solution leads transition from nanoparticle growth to its etching. At each step, the...

  • Monochromated STEM with a 30 meV-wide, atom-sized electron probe. Krivanek, Ondrej L.; Lovejoy, Tracy C.; Dellby, Niklas; Carpenter, R.W. // Microscopy;Feb2013, Vol. 62 Issue 1, p3 

    The origins and the recent accomplishments of aberration correction in scanning transmission electron microscopy (STEM) are reviewed. It is remembered that the successful correction of imaging aberrations of round lenses owes much to the successful correction of spectrum aberrations achieved in...

  • Impact of Precipitate Morphology on the Dissolution and Grain-Coarsening Behavior of a Ti-Nb Microalloyed Linepipe Steel. Solis-Bravo, Gregorio; Merwin, Matthew; Garcia, C. Isaac // Metals (2075-4701);Jan2020, Vol. 10 Issue 1, p89 

    The relationship between precipitate morphology and dissolution on grain coarsening behavior was studied in two Ti-Nb microalloyed Linepipe (LP) Steels. The developed understanding highlights the importance of the complex relationship between precipitate constitutive make-up, dissolution...

  • Helium ion microscopy promises better resolution than SEME. P. L. // Solid State Technology;Sep2006, Vol. 49 Issue 9, p22 

    The article reports on the advantages that can be acquired in helium ion microscopy. As presented by ALIS Corp., a new helium ion-based scanning technology can produce higher-resolution images with more contrast compared to scanning electron microscopy. ALIS stated that the helium ions may be...

  • Multiple-scanning-probe tunneling microscope with nanoscale positional recognition function. Higuchi, Seiji; Kuramochi, Hiromi; Laurent, Olivier; Komatsubara, Takashi; Machida, Shinichi; Aono, Masakazu; Obori, Kenichi; Nakayama, Tomonobu // Review of Scientific Instruments;Jul2010, Vol. 81 Issue 7, p073706 

    Over the past decade, multiple-scanning-probe microscope systems with independently controlled probes have been developed for nanoscale electrical measurements. We developed a quadruple-scanning-probe tunneling microscope (QSPTM) that can determine and control the probe position through...

  • Adhesive-free colloidal probes for nanoscale force measurements: Production and characterization. Indrieri, M.; Podestà, A.; Bongiorno, G.; Marchesi, D.; Milani, P. // Review of Scientific Instruments;Feb2011, Vol. 82 Issue 2, p023708 

    We describe novel approaches for the production and characterization of epoxy- and adhesive-free colloidal probes for atomic force microscopy (AFM). Borosilicate glass microspheres are strongly attached to commercial AFM cantilevers exploiting the capillary adhesion force due to the formation of...

  • Probing the domain structure of BiFeO3 epitaxial films with three-dimensional reciprocal space mapping. Luo, Z. L.; Huang, H.; Zhou, H.; Chen, Z. H.; Yang, Y.; Wu, L.; Zhu, C.; Wang, H.; Yang, M.; Hu, S.; Wen, H.; Zhang, X.; Zhang, Z.; Chen, L.; Fong, D. D.; Gao, C. // Applied Physics Letters;5/5/2014, Vol. 104 Issue 18, p1 

    High-resolution 3-Dimensional Reciprocal Space Mapping (3D-RSM) has been performed on mixed-phase BiFeO3 (BFO) epitaxial films on (001)-oriented LaAlO3 substrates. Our results demonstrate that 3D-RSM is an effective way to present a structural overview of the different BFO polymorphs, domain...

  • Vacuum compatible high-sensitive Kelvin probe force microscopy. Kikukawa, Atsushi; Hosaka, Sumio; Imura, Ryo // Review of Scientific Instruments;Apr96, Vol. 67 Issue 4, p1463 

    Presents a vacuum compatible Kelvin probe force microscopy (KPFM). Overcoming of the difficulties of operating KPFM; Improvement of the potential measurement sensitivity; Observation of a silicon wafer whose surface is partially doped with arsenic by ion implantation.

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics