Polarity-dependent photoemission spectra of wurtzite-type zinc oxide

Ohashi, Naoki; Adachi, Yutaka; Ohsawa, Takeo; Matsumoto, Kenji; Sakaguchi, Isao; Haneda, Hajime; Ueda, Shigenori; Yoshikawa, Hideki; Kobayashi, Keisuke
March 2009
Applied Physics Letters;3/23/2009, Vol. 94 Issue 12, p122102
Academic Journal
Electronic structures of the polar and nonpolar surfaces of ZnO were investigated by hard x-ray photoelectron spectroscopy (HXPES) using synchrotron radiation. The profile of HXPES spectra in the valence band region varied with the crystalline orientation (polarity) of the surface. This polarity dependence was always found in the HXPES spectra regardless of sample conditions such as surface treatment and doping. The possible origin of the polarity dependence of HXPES spectra is discussed in terms of spontaneous polarization.


Related Articles

  • Determination of the individual atomic site contribution to the electronic structure of 3,4,9,10-perylene-tetracarboxylic-dianhydride (PTCDA). Cho, S. W.; Newby, D.; DeMasi, A.; Smith, K. E.; Piper, L. F. J.; Jones, T. S. // Journal of Chemical Physics;Nov2013, Vol. 139 Issue 18, p184711 

    We have studied the element and orbital-specific electronic structure of thin films of 3,4,9,10-perylene-tetracarboxylic-dianhydride (PTCDA) using a combination of synchrotron radiation-exited resonant x-ray emission spectroscopy, x-ray absorption spectroscopy, x-ray photoelectron spectroscopy,...

  • Growth and electronic structure of Sm on thin Al2O3/Ni3Al(111) films. Xu, Qian; Hu, Shanwei; Cheng, Dingling; Feng, Xuefei; Han, Yong; Zhu, Junfa // Journal of Chemical Physics;4/12/2012, Vol. 136 Issue 15, p154705 

    The growth and electronic structure of vapor-deposited Sm on a well-ordered Al2O3/Ni3Al(111) ultrathin film under ultrahigh vacuum conditions at room temperature have been studied comprehensively using synchrotron radiation photoemission spectroscopy, X-ray photoelectron spectroscopy, work...

  • Chemical states of GeTe thin-film during structural phase-change by annealing in ultra-high vacuum. Ko, C.; Lee, Y. M.; Shin, H. J.; Jung, M.-C.; Han, M.; Kim, K.; Park, J. C.; Song, S. A.; Jeong, H. S. // European Physical Journal B -- Condensed Matter;Oct2008, Vol. 66 Issue 2, p171 

    The chemical states of GeTe thin film are investigated using high-resolution X-ray photoelectron spectroscopy (HRXPS) with synchrotron radiation, during amorphous to crystalline structural phase transition. As the temperature increases from 250 to 400 �C, we observe the rock-salt...

  • Oxidation of the porous silicon surface under the action of a pulsed ionic beam: XPS and XANES studies. Bolotov, V.; Ivlev, K.; Korusenko, P.; Nesov, S.; Povoroznyuk, S. // Physics of the Solid State;Jun2014, Vol. 56 Issue 6, p1256 

    The changes in the electronic structure and phase composition of porous silicon under action of pulsed ionic beams have been studied by X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge spectroscopy (XANES) using synchrotron radiation. The Si 2 p and O 1 s core photoemission...

  • Light-induced changes in an alkali metal atomic vapor cell coating studied by X-ray photoelectron spectroscopy. Hibberd, A. M.; Seltzer, S. J.; Balabas, M. V.; Morse, M.; Budker, D.; Bernasek, S. L. // Journal of Applied Physics;Sep2013, Vol. 114 Issue 9, p094513 

    The light-induced desorption of Rb atoms from a paraffin coating is studied with depth-profiling X-ray photoelectron spectroscopy (XPS) using tunable synchrotron radiation. Following Rb exposure, shifts of the C1s signal to higher binding energies, as well as the appearance of lower binding...

  • Core electron level structure in C60F18 and C60F36 fluorinated fullerenes. Mikoushkin, V. M.; Shnitov, V. V.; Bryzgalov, V. V.; Gordeev, Yu. S.; Boltalina, O. V.; Goldt, I. V.; Molodtsov, S. L.; Vyalikh, D. V. // Technical Physics Letters;Mar2009, Vol. 35 Issue 3, p256 

    The structure of C1 s and F1 s core electron levels in C60F18 and C60F36 fluorinated fullerenes has been studied by X-ray photoelectron spectroscopy using synchrotron radiation. It is established that C1 s levels of carbon atoms not bound to fluorine in these compounds are shifted down by 1.0...

  • 5p Electronic properties of Gd in Gd@C82(OH)x studied by synchrotron radiation XPS. Tang, Jun; Xing, Gengmei; Yuan, Hui; Gao, Xingfa; Jing, Long; Wang, Shukuan; Cheng, Yue; Zhao, Yuliang // Journal of Radioanalytical & Nuclear Chemistry;May2007, Vol. 272 Issue 2, p307 

    The electronic properties of the metal atoms encaged in a fullerence cage were investigated using synchrotron X-ray photoelectron spectroscopy. Systematic variations in photoemission of valence band of Gd@C82, Gd@C82(OH)12, and Gd@C82(OH)22 were observed in Gd 5p levels. The results suggest that...

  • Non-destructive depth profile analysis using synchrotron radiation excited XPS. Zier, Michael; Oswald, Steffen; Reiche, Rainer; Wetzig, Klaus // Microchimica Acta;Dec2006, Vol. 156 Issue 1/2, p99 

    We have used synchrotron radiation as excitation source in an X-ray photoelectron spectroscopy (XPS) experiment to analyse surface-near element depth profiles non-dectructively. By tuning the photon energy one can vary the kinetic energy of the photoelectrons and in turn the information depth of...

  • Size dependence of Si 2p core-level shift at Si nanocrystal/SiO2 interfaces. Kim, Sung; Kim, Min Choul; Choi, Suk-Ho; Kim, Kyung Joong; Hwang, Han Na; Hwang, Chan Cook // Applied Physics Letters;9/3/2007, Vol. 91 Issue 10, p103113 

    Synchrotron-radiation x-ray photoelectron spectroscopy (XPS) has been used to analyze size-dependent Si 2p core-level spectra of Si nanocrystals (NCs) embedded in SiO2. The Si0 and suboxide XPS peaks of Si NCs shift to higher binding energies with decreasing NC size, which is based on the...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics